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- W2000249401 abstract "Abstract A specimen holder for in-situ measurements of electrical conductivity in a high voltage electron microscope (HVEM) was developed. The performance of newly developed holder was checked by measuring the temperature dependence of the electrical conductivity in ZrO 2 3mol%Y 2 O 3 (YSZ) and the radiation induced conductivity was subsequently measured in YSZ, α-Al 2 O 3 and MgAl 2 O 4 during irradiation with 1 MeV electrons. The electrical conductivity under irradiation, σ, depends on the flux as σ=σ 0 + δφ d where σ 0 is the conductivity in the absence of radiation, δ a constant, φ electron flux and d the exponent of the flux dependence. The values of d are 1.3±0.2 for YSZ and 1.0±0.1 for both α-Al 2 O 3 and MgAl 2 O 4 . The electrical conductivity in α-Al 2 O 3 was measured at 723 K during irradiation with a 1 MeV electron flux of 2.0 × 10 18 e/m 2 s with an applied electric field of 130 V/mm. No radiation induced electrical degradation was found in α-Al 2 O 3 up to a fluence of 8.0 × 10 22 e/m 2 ." @default.
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- W2000249401 date "1996-10-01" @default.
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- W2000249401 title "Measurements of electrical conductivity of ceramics under electron irradiation in a high voltage electron microscope" @default.
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- W2000249401 doi "https://doi.org/10.1016/s0022-3115(96)00100-6" @default.
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