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• W2000377561 abstract "For performing electron-beam-induced current (EBIC) measurements on sufficiently large samples, the use of a ‘‘planar-collector geometry’’ (i.e., with the collector covering part of the irradiated surface itself) is very attractive. However, the pertinent theoretical EBIC curves for finite surface-recombination velocities s have so far been lacking. This paper presents the complete theoretical expressions for arbitrary values of s and diffusion length L. Simple asymptotic solutions are given for point- and finite-size generation sources. Easy methods are developed to facilitate the application of these solutions in the practical evaluation of L and s from experimental EBIC curves. These methods are applied to experimental data available through the literature." @default.
• W2000377561 created "2016-06-24" @default.
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• W2000377561 date "1985-03-15" @default.
• W2000377561 modified "2023-10-17" @default.
• W2000377561 title "Evaluation of diffusion length and surface-recombination velocity from a planar-collector-geometry electron-beam-induced current scan" @default.
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• W2000377561 doi "https://doi.org/10.1063/1.334400" @default.
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