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• W2000454444 abstract "We report on measurements of the light absorption efficiency of InSb nanowires. The absorbed 70 fs light pulse generates carriers, which equilibrate with the lattice via electron-phonon coupling. The increase in lattice temperature is manifested as a strain that can be measured with X-ray diffraction. The diffracted X-ray signal from the excited sample was measured using a streak camera. The amount of absorbed light was deduced by comparing X-ray diffraction measurements with simulations. It was found that 3.0(6)% of the radiation incident on the sample was absorbed by the nanowires, which cover 2.5% of the sample." @default.
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• W2000454444 date "2013-12-10" @default.
• W2000454444 modified "2023-10-18" @default.
• W2000454444 title "Measurements of light absorption efficiency in InSb nanowires" @default.
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• W2000454444 doi "https://doi.org/10.1063/1.4833559" @default.
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