FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2000472615> ?p ?o ?g. }

• W2000472615 abstract "Summary form only given. The continued advancements in micro and nanotechnology (MNT) for the development of miniaturized sensors, actuators, and other emerging devices is growing at a rapid pace and predictions of future growth are impressive and exciting. The impact of these technologies are seen in many industrial sectors, recently for example in the semiconductor industry, the International Technology Roadmap for Semiconductors (ITRS) is in the process of adding working groups on MEMS. The reliability of these technologies also continues to grow in importance, as it is major factor in the success of MNT enabled products. New technologies can only gain acceptance by customers and consumers only when product reliability is not a concern or product life is well defined. Thus, the manufacturers of advanced sensor devices are constantly mindful of this fact, and incorporate reliability all through the product life cycle, from the early conceptual phase, through development and all the way to production introduction, product shipment and field operation. Along with the focus on reliability science, manufacturers today must be capable of fast yield ramps to recoup their investment costs. The semiconductor industry has shown the link between high yield and excellent field reliability. Thus the central question is, what is needed in the MNT product reliability arena for continued advancement? Quite simply, it is the existence of structure around the reliability aspects of this technology that will enhance field reliability for these emerging technologies. Important to such structure is the creation of standards especially relating to techniques for test and characterization of properties for materials used in miniaturized devices. Also necessary are predictive models for DfR (Design for Reliability) and early screening testing, allowing for less cycles of learning in fabrication (which translates to higher initial fab yields) and faster introduction to the marketplace. Metrology, or the science of measurement, is sprinting to try to keep up with new developments in MNT technology. Metrology is critical to producing data in development and manufacturing of these new devices and this data is required for yield enhancement and reliability programs. One example of the importance of metrology is the use of nanoparticles in gas sensor applications. How does one measure quantify/characterize a distribution of nanometer sized particles, and how does one measure the adsorption of targeted gases to determine that these materials have excellent selectivity to the gases of interest? With the plethora of data gathered in the manufacturing line (through test structure metrology at each step) as well as producing accelerated testing data, the physics of failure can be identified through a structured FMEA process. Acceleration factors for the specific physics of failure for the various failure mechanisms of the high variety of sensors and MEMS are also necessary for long-term field performance prediction. Device manufacturers will claim reliability performance, but how does the customer qualify that the manufacturer's claims are accurate? A level of structure around application specific standards for reliability testing is required so that this industry can continue to develop at a record pace while sustaining high product reliability levels." @default.
• W2000472615 created "2016-06-24" @default.
• W2000472615 creator A5031951594 @default.
• W2000472615 creator A5043997916 @default.
• W2000472615 date "2007-01-01" @default.
• W2000472615 modified "2023-09-25" @default.
• W2000472615 title "Reliability Issues in Miniaturized Sensors: Importance of Standards. What is needed?" @default.
• W2000472615 doi "https://doi.org/10.1109/icsens.2007.4388331" @default.
• W2000472615 hasPublicationYear "2007" @default.
• W2000472615 type Work @default.
• W2000472615 sameAs 2000472615 @default.
• W2000472615 citedByCount "3" @default.
• W2000472615 countsByYear W20004726152013 @default.
• W2000472615 countsByYear W20004726152021 @default.
• W2000472615 countsByYear W20004726152022 @default.
• W2000472615 crossrefType "proceedings-article" @default.
• W2000472615 hasAuthorship W2000472615A5031951594 @default.
• W2000472615 hasAuthorship W2000472615A5043997916 @default.
• W2000472615 hasConcept C111919701 @default.
• W2000472615 hasConcept C112930515 @default.
• W2000472615 hasConcept C117671659 @default.
• W2000472615 hasConcept C121332964 @default.
• W2000472615 hasConcept C127413603 @default.
• W2000472615 hasConcept C13280743 @default.
• W2000472615 hasConcept C144133560 @default.
• W2000472615 hasConcept C154945302 @default.
• W2000472615 hasConcept C162853370 @default.
• W2000472615 hasConcept C163258240 @default.
• W2000472615 hasConcept C19351080 @default.
• W2000472615 hasConcept C194304873 @default.
• W2000472615 hasConcept C200601418 @default.
• W2000472615 hasConcept C201995342 @default.
• W2000472615 hasConcept C202444582 @default.
• W2000472615 hasConcept C205649164 @default.
• W2000472615 hasConcept C207267971 @default.
• W2000472615 hasConcept C2524010 @default.
• W2000472615 hasConcept C2777526511 @default.
• W2000472615 hasConcept C33923547 @default.
• W2000472615 hasConcept C41008148 @default.
• W2000472615 hasConcept C43214815 @default.
• W2000472615 hasConcept C62520636 @default.
• W2000472615 hasConcept C90673727 @default.
• W2000472615 hasConcept C9652623 @default.
• W2000472615 hasConcept C98045186 @default.
• W2000472615 hasConceptScore W2000472615C111919701 @default.
• W2000472615 hasConceptScore W2000472615C112930515 @default.
• W2000472615 hasConceptScore W2000472615C117671659 @default.
• W2000472615 hasConceptScore W2000472615C121332964 @default.
• W2000472615 hasConceptScore W2000472615C127413603 @default.
• W2000472615 hasConceptScore W2000472615C13280743 @default.
• W2000472615 hasConceptScore W2000472615C144133560 @default.
• W2000472615 hasConceptScore W2000472615C154945302 @default.
• W2000472615 hasConceptScore W2000472615C162853370 @default.
• W2000472615 hasConceptScore W2000472615C163258240 @default.
• W2000472615 hasConceptScore W2000472615C19351080 @default.
• W2000472615 hasConceptScore W2000472615C194304873 @default.
• W2000472615 hasConceptScore W2000472615C200601418 @default.
• W2000472615 hasConceptScore W2000472615C201995342 @default.
• W2000472615 hasConceptScore W2000472615C202444582 @default.
• W2000472615 hasConceptScore W2000472615C205649164 @default.
• W2000472615 hasConceptScore W2000472615C207267971 @default.
• W2000472615 hasConceptScore W2000472615C2524010 @default.
• W2000472615 hasConceptScore W2000472615C2777526511 @default.
• W2000472615 hasConceptScore W2000472615C33923547 @default.
• W2000472615 hasConceptScore W2000472615C41008148 @default.
• W2000472615 hasConceptScore W2000472615C43214815 @default.
• W2000472615 hasConceptScore W2000472615C62520636 @default.
• W2000472615 hasConceptScore W2000472615C90673727 @default.
• W2000472615 hasConceptScore W2000472615C9652623 @default.
• W2000472615 hasConceptScore W2000472615C98045186 @default.
• W2000472615 hasLocation W20004726151 @default.
• W2000472615 hasOpenAccess W2000472615 @default.
• W2000472615 hasPrimaryLocation W20004726151 @default.
• W2000472615 hasRelatedWork W1485645432 @default.
• W2000472615 hasRelatedWork W1607054433 @default.
• W2000472615 hasRelatedWork W2007959507 @default.
• W2000472615 hasRelatedWork W2033512842 @default.
• W2000472615 hasRelatedWork W2317773610 @default.
• W2000472615 hasRelatedWork W2323068417 @default.
• W2000472615 hasRelatedWork W2374901194 @default.
• W2000472615 hasRelatedWork W2764722704 @default.
• W2000472615 hasRelatedWork W2905648254 @default.
• W2000472615 hasRelatedWork W3005535424 @default.
• W2000472615 isParatext "false" @default.
• W2000472615 isRetracted "false" @default.
• W2000472615 magId "2000472615" @default.
• W2000472615 workType "article" @default.