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- W2000477268 abstract "Analytical methods for the nondestructive characterization of thin epitaxial films, multilayers and superlattices by x-ray diffraction that have been developed in the last decade are reviewed in three sections: I. Description of the strain state by the strain tensor and determination of homogeneous strains and stresses by double-crystal diffractometry in Bragg case reflection; II. Determination of inhomogeneous strains, such as strain gradients or periodic strain modulations, by double-crystal diffractometry in Bragg case reflection; III. Characterization parallel to the surface by grazing-incidence x-ray diffraction." @default.
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- W2000477268 date "1989-01-01" @default.
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- W2000477268 title "X-ray diffraction studies of thin films and multilayer structures" @default.
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- W2000477268 doi "https://doi.org/10.1016/0146-3535(89)90024-5" @default.
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