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- W2000525753 abstract "physica status solidi (a)Volume 57, Issue 1 p. K11-K15 Short Note Empirical equations for predicting resistivity changes with fluence for electron-irradiated silicon K. Yasuda, K. Yasuda Government Industrial Research Institute, Nagoya Search for more papers by this authorM. Takeda, M. Takeda Government Industrial Research Institute, Nagoya Search for more papers by this authorH. Masuda, H. Masuda Government Industrial Research Institute, Nagoya Search for more papers by this authorS. Ikuta, S. Ikuta Government Industrial Research Institute, Nagoya Search for more papers by this authorT. Wada, T. Wada Department of Electrical Engineering, Mie UniversitySearch for more papers by this author K. Yasuda, K. Yasuda Government Industrial Research Institute, Nagoya Search for more papers by this authorM. Takeda, M. Takeda Government Industrial Research Institute, Nagoya Search for more papers by this authorH. Masuda, H. Masuda Government Industrial Research Institute, Nagoya Search for more papers by this authorS. Ikuta, S. Ikuta Government Industrial Research Institute, Nagoya Search for more papers by this authorT. Wada, T. Wada Department of Electrical Engineering, Mie UniversitySearch for more papers by this author First published: 16 January 1980 https://doi.org/10.1002/pssa.2210570156Citations: 4 Agency of Industrial Science and Technology, Ministry of International Trade and Industry, Hirate-Machi, Kita-Ku, Nagoya, Japan. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume57, Issue116 January 1980Pages K11-K15 RelatedInformation" @default.
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- W2000525753 title "Empirical equations for predicting resistivity changes with fluence for electron-irradiated silicon" @default.
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