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- W2000537584 abstract "Beam diagnostics are an essential constituent of any accelerator. There are a large variety of beam parameters, and total current is one of the most important parameters for accelerators. A current monitor is used to operate an accelerator efficiently and to improve the performance of the machine. A Faraday cup is the most fundamental current detection process, in which charged particles are stopped in the cup. However, this destructive method cannot be applied for high-current or high-energy beams because the total energy carried by the beam can destroy and activate the intercepting material. Therefore, non-destructive beam current measurement requires the use of current transformers that detect the magnetic field produced by the pulsed or DC beam. On the other hand, a new type of beam current monitor using a low-temperature superconducting (LTS) magnetic shield and an LTS SQUID was developed to measure the faint ion beams that are below the lowest measurable limit of the DC current transformer (DCCT) for atomic-physics studies. Recently, a prototype of a highly sensitive SQUID current monitor for measuring the intensity of faint beams, such as radioisotope beams, was completed for the RIKEN RI beam factory. This monitor is composed of a high-temperature superconducting (HTS) magnetic shield and an HTS SQUID. The first measurements using ion beams were carried out in the CNS experimental hall and RIKEN Ring Cyclotron (RRC). This paper first describes the principle of the conventional current monitor such as the Faraday cup and current transformers. Second, the progress of the LTS SQUID current monitor is discussed, and finally, the present status of the prototype of the HTS SQUID current monitor at RIKEN and the results of the first beam measurement are given." @default.
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- W2000537584 date "2003-01-01" @default.
- W2000537584 modified "2023-10-18" @default.
- W2000537584 title "Development of a Highly Sensitive Beam Current Monitor with a SQUID and Superconducting Magnetic Shield" @default.
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- W2000537584 doi "https://doi.org/10.2221/jcsj.38.509" @default.
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