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- W2000577584 abstract "We have investigated the electrical, optical and mechanical properties of CrNy and Cr1−xSixN1.02 films as a function of N and Si contents near the fcc-CrN stoichiometric composition. Polycrystalline CrNy with 0.93<y<1.15 and Cr1−xSixN1.02 with 0<x<0.16 were deposited by reactive magnetron sputtering. Optical reflectivity and electrical resistivity measurements indicate that the electronic properties of CrNy and Cr1−xSixN1.02 thin films are strongly dependent on their chemical composition. The main changes in the optical properties of CrNy and Cr1−xSixN1.02 films as a function of N or Si content mainly occur below 1.5 eV. Substoichiometric CrNy films with 0.93<y<0.98 exhibit room temperature resistivity ρRT values of (1.2–7)×10−3 Ω cm, metallic behavior and an antiferromagnetic orthorhombic phase transition at approximately 260 K. In contrast, overstoichiometric CrNy (1.05<y<1.15) and Cr1−xSixN1.02 films exhibit ρRT values of (1.2–4)×10−2 Ω cm and negative temperature coefficients of resistivity. Finally, the hardness values of CrNy films depend little on the chemical composition but are influenced by the film morphology: the nanohardness values of (1 1 1) CrNy are typically 12–14 GPa while (0 0 2) CrNy exhibit nanohardness values of 18 GPa. The addition of small amounts of Si increases the hardness values up to 22 GPa for Cr0.94Si0.06N1.02." @default.
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- W2000577584 date "2004-01-01" @default.
- W2000577584 modified "2023-10-11" @default.
- W2000577584 title "Electrical, optical and mechanical properties of sputtered CrNy and Cr1−xSixN1.02 thin films" @default.
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- W2000577584 doi "https://doi.org/10.1016/s0040-6090(03)01113-1" @default.
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