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• W2000580189 abstract "The optical and electronic properties of Tl-chalcogenide, wide gap semiconductors, TlGaSe₂, Tl₆I₄Se, and Tl₂Au₄S₃ for x-ray and &#947; ray detection were characterized. The semiconductor crystals are grown by the modified Bridgman method. The optical absorption and band gap energy of the materials were determined from UV-Vis-near IR transmission and reflection spectra. The mobility-lifetime products were measured. For Tl₆I₄Se the values were comparable to those of CdZnTe. We measured room temperature detector response to x-ray and &#947; ray radiations. Under ⁵⁷Co radiation, Tl₆I₄Se has a well-resolved spectral response and peak FWHM comparable to those of Cd_0.9Zn_0.1Te." @default.
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• W2000580189 date "2011-05-13" @default.
• W2000580189 modified "2023-09-23" @default.
• W2000580189 title "Tl-based wide gap semiconductor materials for x-ray and gamma ray detection" @default.
• W2000580189 doi "https://doi.org/10.1117/12.883230" @default.
• W2000580189 hasPublicationYear "2011" @default.
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