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• W2000591648 abstract "The interaction of cobalt with clean silicon surfaces has been studied by low-energy electron diffraction (LEED) and Auger electron spectroscopy (AES). A number of previously unknown surface structures was observed on Si(111), (100) and (110) surfaces at Co submonolayer coverages. Correlation between the surface structures and Co surface concentration has been investigated in a wide range of sample temperatures in the solid phase epitaxy (SPE) and molecular beam epitaxy (MBE) modes. Co diffusion coefficients on Si surfaces have been evaluated. It follows from our data that they do not exceed the coefficients of Co diffusion in Si bulk." @default.
• W2000591648 created "2016-06-24" @default.
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• W2000591648 date "1997-02-01" @default.
• W2000591648 modified "2023-09-26" @default.
• W2000591648 title "Co interaction with clean silicon surfaces" @default.
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• W2000591648 doi "https://doi.org/10.1016/s0039-6028(96)01150-8" @default.
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