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- W2000635525 abstract "A topological defect, which is formed at the boundary between the two stable superstructures on the clean Ge(001) surface, $c(4ifmmodetimeselsetexttimesfi{}2)$ and $p(2ifmmodetimeselsetexttimesfi{}2)$, can be laterally manipulated at $80phantom{rule{0.3em}{0ex}}mathrm{K}$ by injection of carriers into the surface states from a metal tip of the scanning tunneling microscope (STM). We measured the probability of the defect motion as functions of the direction from the defect to the injection point, the distance between them, and the bias voltage during the carrier injection. Observed anisotropy of the probability on the lateral directions is attributed to the anisotropic propagation of the carriers in the surface electron and hole bands. For the electron propagation, the probability at the fixed distance in the directions both parallel and perpendicular to the Ge dimer axis is larger on the $p(2ifmmodetimeselsetexttimesfi{}2)$ surface than on the $c(4ifmmodetimeselsetexttimesfi{}2)$ surface. The observed decay of the standing waves of the surface ${ensuremath{pi}}^{*}$ electrons indicates that the difference is caused by the energy relaxation of electrons due to inelastic scattering. The most stable position of the defect depends on the sample bias voltage during the carrier injection. This suggests that the electric field due to the STM tip mainly determines the direction of the defect motion." @default.
- W2000635525 created "2016-06-24" @default.
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- W2000635525 date "2007-03-07" @default.
- W2000635525 modified "2023-10-01" @default.
- W2000635525 title "Superstructure manipulation on a clean Ge(001) surface by carrier injection using an STM" @default.
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- W2000635525 doi "https://doi.org/10.1103/physrevb.75.115304" @default.
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