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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2000741511> ?p ?o ?g. }

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• W2000741511 abstract "The possibility to investigate complex magnetic profiles throughout an ultrathin magnetic film or an interface by soft x-ray resonant magnetic reflectivity is presented. The determination of in- and out-of-plane magnetic profile is shown to be possible with a subnanometer resolution by measuring the reflectivity over a wide angular range. The technique is applied to a granular magnetic multilayer and to a perpendicular exchange bias coupled system." @default.
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• W2000741511 date "2010-02-01" @default.
• W2000741511 modified "2023-10-16" @default.
• W2000741511 title "Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films" @default.
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• W2000741511 doi "https://doi.org/10.1088/1742-6596/211/1/012015" @default.
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