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• W2000766157 startingPage "1553" @default.
• W2000766157 abstract "The nature of oxide phases at metal–oxide interfaces, i.e. of oxide layers in the proximity of a metal surface, is assessed by critically examining the available data in the literature. The data reveal a trend towards the formation of reduced oxide phases with lower oxidation states in the vicinity of the interface with a metal. The physical origin of these interface-stabilized oxide layers is discussed and the possible causes include strong metal–metal bonding, high oxygen affinity of the substrate metal, reduction of the interfacial strain, and the stability of two-dimensional oxide phases." @default.
• W2000766157 created "2016-06-24" @default.
• W2000766157 creator A5086132801 @default.
• W2000766157 date "2002-06-01" @default.
• W2000766157 modified "2023-10-06" @default.
• W2000766157 title "INTERFACIAL OXIDE LAYERS AT THE METAL–OXIDE PHASE BOUNDARY" @default.
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• W2000766157 doi "https://doi.org/10.1142/s0218625x02003950" @default.
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