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• W2000776716 endingPage "299" @default.
• W2000776716 startingPage "291" @default.
• W2000776716 abstract "A detailed model has been developed to simulate the Fowler-Nordheim tunneling and degradation characteristics of thermal oxides on silicon incorporating geometry effects, trapping at pre-stress and post-stress trap sites, and field dependent charge to breakdown. For the first time, the effect of gate edge on the time-dependent tunneling characteristics has been quantitatively analyzed, using the Schwarz-Christoffel transformation method. It is found that gate edge region can enhance the tunneling current significantly and also accelerate oxide degradation and breakdown. One application of this model is to remove geometry effects in the oxide parameters extracted using ramp-stress measurements. Another application is to use the asymmetry in gate and substrate injections to electrically characterize the gate geometry and obtain an effective edge curvature." @default.
• W2000776716 created "2016-06-24" @default.
• W2000776716 creator A5018163784 @default.
• W2000776716 creator A5070119438 @default.
• W2000776716 date "1991-03-01" @default.
• W2000776716 modified "2023-10-01" @default.
• W2000776716 title "Simulation of time-dependent tunneling characteristics of MOS structures" @default.
• W2000776716 cites W1969769240 @default.
• W2000776716 cites W1978269028 @default.
• W2000776716 cites W1980584607 @default.
• W2000776716 cites W1985854158 @default.
• W2000776716 cites W1990600621 @default.
• W2000776716 cites W1998521692 @default.
• W2000776716 cites W1999750215 @default.
• W2000776716 cites W2017544592 @default.
• W2000776716 cites W2020155680 @default.
• W2000776716 cites W2044435263 @default.
• W2000776716 cites W2045728075 @default.
• W2000776716 cites W2045780268 @default.
• W2000776716 cites W2047832448 @default.
• W2000776716 cites W2058017702 @default.
• W2000776716 cites W2063066474 @default.
• W2000776716 cites W2072215662 @default.
• W2000776716 cites W2077205329 @default.
• W2000776716 cites W2156591889 @default.
• W2000776716 doi "https://doi.org/10.1016/0038-1101(91)90187-4" @default.
• W2000776716 hasPublicationYear "1991" @default.
• W2000776716 type Work @default.
• W2000776716 sameAs 2000776716 @default.
• W2000776716 citedByCount "2" @default.
• W2000776716 crossrefType "journal-article" @default.
• W2000776716 hasAuthorship W2000776716A5018163784 @default.
• W2000776716 hasAuthorship W2000776716A5070119438 @default.
• W2000776716 hasConcept C111368507 @default.
• W2000776716 hasConcept C119599485 @default.
• W2000776716 hasConcept C120398109 @default.
• W2000776716 hasConcept C121332964 @default.
• W2000776716 hasConcept C127313418 @default.
• W2000776716 hasConcept C127413603 @default.
• W2000776716 hasConcept C138885662 @default.
• W2000776716 hasConcept C152909973 @default.
• W2000776716 hasConcept C153294291 @default.
• W2000776716 hasConcept C162307627 @default.
• W2000776716 hasConcept C165801399 @default.
• W2000776716 hasConcept C172385210 @default.
• W2000776716 hasConcept C18903297 @default.
• W2000776716 hasConcept C191897082 @default.
• W2000776716 hasConcept C192562407 @default.
• W2000776716 hasConcept C195065555 @default.
• W2000776716 hasConcept C204530211 @default.
• W2000776716 hasConcept C21036866 @default.
• W2000776716 hasConcept C2361726 @default.
• W2000776716 hasConcept C2524010 @default.
• W2000776716 hasConcept C26873012 @default.
• W2000776716 hasConcept C2777289219 @default.
• W2000776716 hasConcept C2777924906 @default.
• W2000776716 hasConcept C2779851234 @default.
• W2000776716 hasConcept C33923547 @default.
• W2000776716 hasConcept C41895202 @default.
• W2000776716 hasConcept C49040817 @default.
• W2000776716 hasConcept C544956773 @default.
• W2000776716 hasConcept C76155785 @default.
• W2000776716 hasConcept C86803240 @default.
• W2000776716 hasConceptScore W2000776716C111368507 @default.
• W2000776716 hasConceptScore W2000776716C119599485 @default.
• W2000776716 hasConceptScore W2000776716C120398109 @default.
• W2000776716 hasConceptScore W2000776716C121332964 @default.
• W2000776716 hasConceptScore W2000776716C127313418 @default.
• W2000776716 hasConceptScore W2000776716C127413603 @default.
• W2000776716 hasConceptScore W2000776716C138885662 @default.
• W2000776716 hasConceptScore W2000776716C152909973 @default.
• W2000776716 hasConceptScore W2000776716C153294291 @default.
• W2000776716 hasConceptScore W2000776716C162307627 @default.
• W2000776716 hasConceptScore W2000776716C165801399 @default.
• W2000776716 hasConceptScore W2000776716C172385210 @default.
• W2000776716 hasConceptScore W2000776716C18903297 @default.
• W2000776716 hasConceptScore W2000776716C191897082 @default.
• W2000776716 hasConceptScore W2000776716C192562407 @default.
• W2000776716 hasConceptScore W2000776716C195065555 @default.
• W2000776716 hasConceptScore W2000776716C204530211 @default.
• W2000776716 hasConceptScore W2000776716C21036866 @default.
• W2000776716 hasConceptScore W2000776716C2361726 @default.
• W2000776716 hasConceptScore W2000776716C2524010 @default.
• W2000776716 hasConceptScore W2000776716C26873012 @default.
• W2000776716 hasConceptScore W2000776716C2777289219 @default.
• W2000776716 hasConceptScore W2000776716C2777924906 @default.
• W2000776716 hasConceptScore W2000776716C2779851234 @default.
• W2000776716 hasConceptScore W2000776716C33923547 @default.
• W2000776716 hasConceptScore W2000776716C41895202 @default.
• W2000776716 hasConceptScore W2000776716C49040817 @default.
• W2000776716 hasConceptScore W2000776716C544956773 @default.
• W2000776716 hasConceptScore W2000776716C76155785 @default.
• W2000776716 hasConceptScore W2000776716C86803240 @default.
• W2000776716 hasIssue "3" @default.
• W2000776716 hasLocation W20007767161 @default.
• W2000776716 hasOpenAccess W2000776716 @default.
• W2000776716 hasPrimaryLocation W20007767161 @default.
• W2000776716 hasRelatedWork W1587789486 @default.

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