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- W2000792453 abstract "Fullerene dianions were prepared by low-energy electron attachment to negatively charged fullerene ions C76− and C86− stored in a commercial Penning trap spectrometer under UHV conditions. Up to 85% of trapped monoanions can be converted to dianions upon long-term irradiation with electrons having kinetic energies averaging 6 eV corresponding to an attachment cross-section on the order of 100 Å2 for C76−. The lifetime of the resulting C762− was determined to be >104 s—limited by collisions with residual gas molecules. A model for statistical electron emission based on Klots’ theory is used to provide an upper limit for the dianion temperature." @default.
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- W2000792453 date "2003-09-01" @default.
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- W2000792453 title "Electron attachment to negative fullerene ions: a Fourier transform mass spectrometric study" @default.
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- W2000792453 doi "https://doi.org/10.1016/s1387-3806(03)00260-4" @default.
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