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- W2000794208 abstract "Low-frequency noise measurements, combined with the conventional techniques for the study of InGaN/GaN-based LEDs, make it possible to separate the contribution of conductive paths associated with the extended defect system (EDS) and point defects (PD) to non-radiative recombination processes. These measurements also can reveal physical mechanisms leading to the unpredictable failure of LEDs, such as non-uniform current distribution, local overheating, and presence of local InGaN regions with a reduced band gap width Eg." @default.
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- W2000794208 date "2014-09-01" @default.
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- W2000794208 title "Low-frequency noise in diagnostics of power blue InGaN/GaN LEDs" @default.
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- W2000794208 doi "https://doi.org/10.1016/j.jcrysgro.2013.11.097" @default.
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