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- W2000842643 abstract "La modulation de force en microscopie à force atomique (AFM) permet de cartographier les inhomogénéités des propriétés élastiques de surface. L'influence des contraintes latérales sur l'élasticité de surface a pu être mise en évidence par modulation de force. L'étude a porté sur la face (010) du gypse. Au niveau atomique, les images topographiques diffèrent de celles sondant l'élasticité de surface. Au niveau microscopique, les images d'élasticité dépendent des contraintes exercées sur le cristal. Sans contrainte, la surface présente une élasticité uniforme. Cependant, les contraintes latérales révèlent des phénomènes de glissement, de cisaillement et de nœuds d'élasticité. This paper introduces a new approach to studying the effects of lateral stress on surface elasticity. Recent results in the force modulation with an atomic force microscope (AFM) on the (010) gypsum face are presented and discussed. At the atomic level, the images in the contact mode differ from those mapping the elasticity. At the microscopic level, the images of elasticity vary according to the stress applied to the sample. Without stress, the surface stiffness is uniform. However, a lateral stress induces slipping and shearing processes." @default.
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- W2000842643 date "1997-11-01" @default.
- W2000842643 modified "2023-09-25" @default.
- W2000842643 title "Influence des contraintes sur les propriétés élastiques de surface du gypse sondées par microscopie à force atomique" @default.
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- W2000842643 doi "https://doi.org/10.1016/s1251-8069(97)88172-9" @default.
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