Matches in SemOpenAlex for { <https://semopenalex.org/work/W2000886616> ?p ?o ?g. }
- W2000886616 endingPage "3497" @default.
- W2000886616 startingPage "3473" @default.
- W2000886616 abstract "Laser-ablation ICPMS has become widely accessible as a powerful and efficient multi-element microanalytical technique. One of its key strengths is the ability to analyse a wide concentration range from major (tens of wt.%) to trace (ng/g) levels in minerals and their microscopic inclusions. An ArF excimer laser system (λ = 193 nm) with imaging optics for controlled UV ablation and simultaneous petrographic viewing was designed specifically for representative sampling and quantitative multi-element analysis of microscopic fluid, melt and mineral inclusions beneath the sample surface. After a review of the requirements and recent technical developments, results are presented which together document the reliability and reproducibility of quantitative microanalysis of complex samples such as zoned crystals or fluid and melt inclusions in various host minerals. Analytical errors due to elemental fractionation are reduced to the typical precision achieved by quadrupole LA-ICPMS in multi-element mode (2–5% RSD). This progress is largely due to the small size of aerosol particles generated by the optimized UV optical system. Depth profiling yields representative and accurate concentration results at a resolution of ∼0.1 μm perpendicular to the ablation surface. Ablation is largely matrix-insensitive for different elements, such that silicate and borate glasses, silicates and oxide minerals, or direct liquid ablation can be used interchangeably for external standardization of any homogeneous or heterogeneous material. The absolute ablation rate is material dependent, however, so that quantitative LA-ICPMS analysis requires an internal standard (i.e., an independent constraint such as the absolute concentration of one element). Our approach to quantifying fluid and melt inclusion compositions is described in detail. Experiments with synthetic fluid inclusions show that accurate results are obtained by combining the LA-ICPMS analysis of element concentration ratios with a microthermometric measurement of the NaCl equivalent concentration and an empirical description of the effect of major cations on the final melting temperatures of ice, hydrohalite or halite. Expected calibration errors for NaCl-H2O-dominated fluids are smaller than the typical analytical scatter within an assemblage of simultaneously trapped fluid inclusions. Analytical precision is limited by representative ablation of all phases in heterogeneous inclusions and the integration of transient ICPMS signals, to typically ±10 to 20% RSD. Element concentrations in devitrified and even coarsely crystallized silicate melt inclusions can be reconstituted from LA-ICPMS signals. Deconvolution of inclusion and host signals with internal standardization automatically corrects for sidewall crystallization after melt entrapment at high temperature. A test using melt inclusions in a midocean ridge basalt, a summary of published geochemical studies and a new application to REE analysis of coexisting fluids and mineral phases in carbonatite-related veins illustrate the versatility and some of the strengths and limitations of LA-ICPMS, in comparison with other microanalytical techniques." @default.
- W2000886616 created "2016-06-24" @default.
- W2000886616 creator A5006480202 @default.
- W2000886616 creator A5022447392 @default.
- W2000886616 creator A5024299583 @default.
- W2000886616 creator A5026003233 @default.
- W2000886616 creator A5034219005 @default.
- W2000886616 creator A5052663025 @default.
- W2000886616 creator A5066199626 @default.
- W2000886616 creator A5066572736 @default.
- W2000886616 creator A5079580286 @default.
- W2000886616 creator A5089091413 @default.
- W2000886616 date "2003-09-01" @default.
- W2000886616 modified "2023-10-14" @default.
- W2000886616 title "Quantitative multi-element analysis of minerals, fluid and melt inclusions by laser-ablation inductively-coupled-plasma mass-spectrometry" @default.
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