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- W2000908083 abstract "High-quality ZnMgO/ZnO multi-layer thin films in a-plane orientation were grown by pulsed laser deposition on r-plane sapphires. Reflection high-energy electron diffraction (RHEED) patterns were performed to monitor the growth morphology and the epitaxy. X-ray diffraction, RHEED, and atomic force microscopy show that anisotropic growth of a-plane ZnO results in stripe morphology, and the difference of thermal expansion between ZnO and sapphire plays a significant role on the film surface smoothness. Cross-sectional transmission electron microscopy identifies the cause of disorientation of ZnO growth on sapphire." @default.
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- W2000908083 date "2008-04-01" @default.
- W2000908083 modified "2023-09-27" @default.
- W2000908083 title "Growth of ZnMgO/ZnO films on r-plane sapphires by pulsed laser deposition" @default.
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- W2000908083 doi "https://doi.org/10.1016/j.jcrysgro.2007.11.158" @default.
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