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- W2001063008 abstract "A new technique is presented for separating the threshold-voltage shift of a metal-oxide-semiconductor transistor into shifts due to interface traps and trapped-oxide charge. This technique is applied to threshold-voltage shifts on an n-channel transistor that result from ionizing radiation." @default.
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- W2001063008 title "Simple technique for separating the effects of interface traps and trapped-oxide charge in metal-oxide-semiconductor transistors" @default.
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- W2001063008 doi "https://doi.org/10.1063/1.96974" @default.
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