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- W2001872947 abstract "The influence of charging on the secondary electron emission yield (σ) measurements of MgO is studied. This is done by measuring σ as a function of the primary energy (Ep) of the electron beam of thin layers of MgO deposited on Si. At high Ep, σ decreases when the primary current or the layer thickness increases. At low Ep, we find that σ increases somewhat due to charging. As a result of the measurement technique σ can become smaller than 1, even when Ep is in the energy range where σ is expected to be larger than 1. Furthermore, we observe for some samples the onset of a conduction mechanism at high primary currents. Monte Carlo calculations show that a potential barrier in front of the sample can arise, leading to a partial recapture of the generated secondary electrons. This causes σ to decrease at high Ep. A simplified analytical model is presented to calculate the effect of charging of the sample on the measured value of σ." @default.
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- W2001872947 date "1997-02-01" @default.
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- W2001872947 title "Description of the influence of charging on the measurement of the secondary electron yield of MgO" @default.
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- W2001872947 doi "https://doi.org/10.1016/s0169-4332(96)00730-1" @default.
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