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- W2002032278 abstract "Three-dimensional structures of Ni clusters deposited on a TiO2(110) surface were studied using polarization-dependent total reflection fluorescence X-ray absorption fine structure (PTRF-XAFS) analysis. Three-dimensional Ni clusters were formed with a slightly anisotropic structure at 1 × 1014 atoms/cm2. The PTRF-XAFS results for a 1 × 1014 atoms/cm2 sample revealed the formation of one-atomic-layer Ni clusters with a distorted (110)fcc plane structure. We found a Ni−Ni distance of 0.240 nm with Ni−O interaction at 0.23 nm. The structure was stabilized by interaction of surface oxygen atoms. The origin of cluster size self-regulation was the strong Ni−O interaction and matching of the crystal lattice between TiO2(110) and distorted Ni(110) structures." @default.
- W2002032278 created "2016-06-24" @default.
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- W2002032278 date "2008-03-01" @default.
- W2002032278 modified "2023-10-02" @default.
- W2002032278 title "Origin of Self-Regulated Cluster Growth on the TiO<sub>2</sub>(110) Surface Studied Using Polarization-Dependent Total Reflection Fluorescence XAFS" @default.
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- W2002032278 doi "https://doi.org/10.1021/jp711028w" @default.
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