FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2002096122> ?p ?o ?g. }

• W2002096122 abstract "The results are reported of an experimental study of the hot carrier (HC) and bias-temperature-instability (BTI) reliability of MuGFETS, fabricated on SOI wafers with silicon oxide and silicon nitride buried layers. N- and P-channel devices of 65 nm long and 42nm or 32nm wide channels were stressed and measured at room temperature and at 125°C. A complicated picture emerges: HC degradation is dominant in n-MuGFETs whereas both HC and BTI mechanisms are active concurrently in p-MuGFETs under hot carrier stress. When HC degradation dominates, the wider fin devices tend to degrade more than the narrower; the reverse is generally true for BTI degradation." @default.
• W2002096122 created "2016-06-24" @default.
• W2002096122 creator A5003149290 @default.
• W2002096122 creator A5020964161 @default.
• W2002096122 creator A5029733167 @default.
• W2002096122 creator A5031279878 @default.
• W2002096122 creator A5041418760 @default.
• W2002096122 creator A5043132234 @default.
• W2002096122 creator A5044995953 @default.
• W2002096122 creator A5055173231 @default.
• W2002096122 creator A5059409050 @default.
• W2002096122 creator A5071952503 @default.
• W2002096122 creator A5082528426 @default.
• W2002096122 date "2009-09-01" @default.
• W2002096122 modified "2023-09-22" @default.
• W2002096122 title "Hot carrier (HC) and bias-temperature-instability (BTI) degradation of MuGFETs on silicon oxide and silicon nitride buried layers" @default.
• W2002096122 cites W1592779097 @default.
• W2002096122 cites W2007341673 @default.
• W2002096122 cites W2058303251 @default.
• W2002096122 cites W2110629172 @default.
• W2002096122 cites W2124075039 @default.
• W2002096122 cites W2132252587 @default.
• W2002096122 cites W2138107491 @default.
• W2002096122 cites W2138884007 @default.
• W2002096122 cites W2147301393 @default.
• W2002096122 cites W2165290466 @default.
• W2002096122 cites W2542728252 @default.
• W2002096122 doi "https://doi.org/10.1109/essderc.2009.5331453" @default.
• W2002096122 hasPublicationYear "2009" @default.
• W2002096122 type Work @default.
• W2002096122 sameAs 2002096122 @default.
• W2002096122 citedByCount "3" @default.
• W2002096122 countsByYear W20020961222012 @default.
• W2002096122 crossrefType "proceedings-article" @default.
• W2002096122 hasAuthorship W2002096122A5003149290 @default.
• W2002096122 hasAuthorship W2002096122A5020964161 @default.
• W2002096122 hasAuthorship W2002096122A5029733167 @default.
• W2002096122 hasAuthorship W2002096122A5031279878 @default.
• W2002096122 hasAuthorship W2002096122A5041418760 @default.
• W2002096122 hasAuthorship W2002096122A5043132234 @default.
• W2002096122 hasAuthorship W2002096122A5044995953 @default.
• W2002096122 hasAuthorship W2002096122A5055173231 @default.
• W2002096122 hasAuthorship W2002096122A5059409050 @default.
• W2002096122 hasAuthorship W2002096122A5071952503 @default.
• W2002096122 hasAuthorship W2002096122A5082528426 @default.
• W2002096122 hasConcept C119599485 @default.
• W2002096122 hasConcept C121332964 @default.
• W2002096122 hasConcept C127413603 @default.
• W2002096122 hasConcept C138885662 @default.
• W2002096122 hasConcept C160671074 @default.
• W2002096122 hasConcept C163258240 @default.
• W2002096122 hasConcept C165801399 @default.
• W2002096122 hasConcept C171250308 @default.
• W2002096122 hasConcept C172385210 @default.
• W2002096122 hasConcept C191897082 @default.
• W2002096122 hasConcept C192562407 @default.
• W2002096122 hasConcept C194760766 @default.
• W2002096122 hasConcept C21036866 @default.
• W2002096122 hasConcept C2361726 @default.
• W2002096122 hasConcept C24326235 @default.
• W2002096122 hasConcept C2777431650 @default.
• W2002096122 hasConcept C2778413303 @default.
• W2002096122 hasConcept C2779227376 @default.
• W2002096122 hasConcept C2779679103 @default.
• W2002096122 hasConcept C2779851234 @default.
• W2002096122 hasConcept C41895202 @default.
• W2002096122 hasConcept C43214815 @default.
• W2002096122 hasConcept C49040817 @default.
• W2002096122 hasConcept C53143962 @default.
• W2002096122 hasConcept C544956773 @default.
• W2002096122 hasConcept C557185 @default.
• W2002096122 hasConcept C62520636 @default.
• W2002096122 hasConceptScore W2002096122C119599485 @default.
• W2002096122 hasConceptScore W2002096122C121332964 @default.
• W2002096122 hasConceptScore W2002096122C127413603 @default.
• W2002096122 hasConceptScore W2002096122C138885662 @default.
• W2002096122 hasConceptScore W2002096122C160671074 @default.
• W2002096122 hasConceptScore W2002096122C163258240 @default.
• W2002096122 hasConceptScore W2002096122C165801399 @default.
• W2002096122 hasConceptScore W2002096122C171250308 @default.
• W2002096122 hasConceptScore W2002096122C172385210 @default.
• W2002096122 hasConceptScore W2002096122C191897082 @default.
• W2002096122 hasConceptScore W2002096122C192562407 @default.
• W2002096122 hasConceptScore W2002096122C194760766 @default.
• W2002096122 hasConceptScore W2002096122C21036866 @default.
• W2002096122 hasConceptScore W2002096122C2361726 @default.
• W2002096122 hasConceptScore W2002096122C24326235 @default.
• W2002096122 hasConceptScore W2002096122C2777431650 @default.
• W2002096122 hasConceptScore W2002096122C2778413303 @default.
• W2002096122 hasConceptScore W2002096122C2779227376 @default.
• W2002096122 hasConceptScore W2002096122C2779679103 @default.
• W2002096122 hasConceptScore W2002096122C2779851234 @default.
• W2002096122 hasConceptScore W2002096122C41895202 @default.
• W2002096122 hasConceptScore W2002096122C43214815 @default.
• W2002096122 hasConceptScore W2002096122C49040817 @default.
• W2002096122 hasConceptScore W2002096122C53143962 @default.
• W2002096122 hasConceptScore W2002096122C544956773 @default.
• W2002096122 hasConceptScore W2002096122C557185 @default.
• W2002096122 hasConceptScore W2002096122C62520636 @default.
• W2002096122 hasLocation W20020961221 @default.

• next