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- W2002609186 abstract "Random telegraph signal (RTS) fluctuations with relative amplitude up to 50% are observed in forward and reverse gate current of unstressed and reverse-bias-stressed AlGaN/GaN high electron mobility transistors. Measurements of RTS amplitude and mean pulse widths as a function of forward gate bias indicate that the RTS is due to modulation of current along an intrinsic or stress-induced percolation path across the AlGaN-barrier by electron capture and emission on a trap within the barrier. Processes of electron capture from GaN to trap and subsequent tunneling to metal gate or electron exchange between GaN channel and the trap are considered." @default.
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- W2002609186 date "2012-04-02" @default.
- W2002609186 modified "2023-09-23" @default.
- W2002609186 title "Random telegraph signal noise in gate current of unstressed and reverse-bias-stressed AlGaN/GaN high electron mobility transistors" @default.
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- W2002609186 doi "https://doi.org/10.1063/1.3701164" @default.
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