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• W2003118973 abstract "Spectroscopic techniques such as X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) are applied to the chemical characterization of very thin films (200–250 Å) of BiSrCaCuO fabricated in a two-step process. Amorphous and insulating films are deposited on (001) MgO single crystals by the laser ablation technique (Nd:YAG laser equipped with a frequency-doubling crystal). Although quasi-congruent for the cations, the ablation process induces an oxygen depletion from the stoichiometric superconducting Bi2Sr2CaCu2O8 target. Indeed, the surface sensitive X-ray photoelectron spectroscopy (XPS) evidences the presence of a Bi°/Bi(III) mixture as well as the occurence of Cu(I) alone in the deposited film, instead of Bi(III) and Cu(II) as in the parent target material. Core level binding energies of Column II elements are characteristic of their ionic compounds (oxides and carbonates). A large amount of Cu(I) present in the film depth is confirmed by the more bulk-sensitive soft X-ray absorption spectroscopy (XAS) at Cu 2p threshold, operated in the secondary electron total yield mode. The films need to be annealed in 1 atm O2 at a temperature of 865°C, so that they are converted to the ordered and highly textured Bi2Sr2CaCu2O8 superconducting phase with Tc(R=0)=82 K. After the O2 annealing, XPS indicates a noticeable decrease of the carbonate content. All the bismuth is reoxidized to Bi(III). Cu(I) is also partly converted to Cu(II). In depth, as shown by XAS, there is a complete conversion to Cu(II), which is the oxidation degree of copper in the superconducting material. Remarkably, a part of the spectral weight of Column II elements and oxygen XPS core levels shifts towards smaller binding energies, which is interpreted in terms of the formation of the metallic lamellar compound. It is shown that an ill-reacted insulating compound remains in the outermost layer." @default.
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• W2003118973 date "1991-02-01" @default.
• W2003118973 modified "2023-10-01" @default.
• W2003118973 title "Physicochemistry of laser-deposited BiSrCaCuO thin films studied by XPS and XAS" @default.
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• W2003118973 doi "https://doi.org/10.1016/0169-4332(91)90031-e" @default.
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