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• W2003151915 abstract "Photoluminescence (PL) line width broadening of Zn1−xCdxTe/ZnTe multiple quantum well (MQW), grown on ZnTe (0 0 1) substrates by molecular beam epitaxy (MBE), has been investigated. During the growth, Cd-composition and thickness of QW are controlled by reflection high energy electron diffraction (RHEED) intensity oscillations. PL line width broadening due to an alloy/interface disorder is calculated and compared with experimental results. The PL line width varies closely related to the exciton radius and shows considerable agreement with theoretical values." @default.
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• W2003151915 date "2005-05-01" @default.
• W2003151915 modified "2023-09-27" @default.
• W2003151915 title "Interface disorder of Zn1−xCdxTe/ZnTe multiple quantum wells grown by MBE using RHEED intensity oscillations" @default.
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• W2003151915 doi "https://doi.org/10.1016/j.jcrysgro.2005.01.026" @default.
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