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- W2003155992 abstract "In this article the authors present the main advantages of the micro-Raman scattering (MRS) technique in order to perform non-destructively, sensitive, fast and accurate stress and strain measurements in material systems.In order to check the accuracy of this method, a set of Phonon Deformation Potentials (PDPs) was used, in analysing previously reported Raman data of free-standing ZnS/ZnTe and ZnS/ZnSe superlattices (SLs). In addition, published micro-Raman spectroscopy data concerning micromechanical semiconductor devices (structures) were used in order to evaluate quantitatively their stress (strain) components, presupposing a stress or strain (uniaxial or biaxial) model." @default.
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- W2003155992 date "2003-01-01" @default.
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- W2003155992 title "Micro-Raman scattering as a non-destructive tool in the investigation of solids and stress" @default.
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- W2003155992 doi "https://doi.org/10.1784/insi.45.4.258.52852" @default.
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