FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2003243790> ?p ?o ?g. }

• W2003243790 endingPage "39" @default.
• W2003243790 startingPage "28" @default.
• W2003243790 abstract "The emerging spin transfer torque magnetic random access memory (STT-MRAM) promises many attractive features, such as nonvolatile, high speed and low power etc, which enable it to be a promising candidate for the next-generation logic and memory circuits. However with the continuous scaling technology process, the chip yield and reliability of STT-MRAM face severe challenges due to the increasing permanent and transient faults. Due to the intrinsic fault features and the targeted application requirements of STT-MRAM, traditional fault tolerant design solutions, such as error correction code (ECC), redundancy repair (RR), and fault masking (FM) techniques, cannot be employed straightforwardly for STT-MRAM. In this paper, we propose a synergistic technique framework, named sECC, that integrates both the ECC and FM techniques to address simultaneously the permanent and transient faults. With such approach, permanent faults are masked while transient faults are corrected with the same codeword. Moreover taking into consideration the fact that most permanent faults are sparse [about 60%-70% single isolated faults (SIFs)], we propose further integrating the RR and sECC (named iRRsECC) to optimize the system performance. In this scenario, all the SIFs are masked and the transient faults are corrected with the proposed sECC, while other permanent faulty types (e.g., faulty rows or columns) are repaired with redundant rows or columns. A simulation tool is developed to evaluate the proposed techniques and the evaluation results show their good performance in terms of repair rate and hardware overhead." @default.
• W2003243790 created "2016-06-24" @default.
• W2003243790 creator A5018693228 @default.
• W2003243790 creator A5037048702 @default.
• W2003243790 creator A5039679140 @default.
• W2003243790 creator A5043223926 @default.
• W2003243790 creator A5064212027 @default.
• W2003243790 creator A5066473925 @default.
• W2003243790 creator A5076905500 @default.
• W2003243790 date "2015-03-01" @default.
• W2003243790 modified "2023-09-25" @default.
• W2003243790 title "Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM" @default.
• W2003243790 cites W1964240769 @default.
• W2003243790 cites W1964504828 @default.
• W2003243790 cites W1969011731 @default.
• W2003243790 cites W1969200114 @default.
• W2003243790 cites W1970440339 @default.
• W2003243790 cites W1974831841 @default.
• W2003243790 cites W1978532023 @default.
• W2003243790 cites W1985478976 @default.
• W2003243790 cites W1985887979 @default.
• W2003243790 cites W1986389751 @default.
• W2003243790 cites W1991720749 @default.
• W2003243790 cites W1991813033 @default.
• W2003243790 cites W2023789407 @default.
• W2003243790 cites W2025173691 @default.
• W2003243790 cites W2025473704 @default.
• W2003243790 cites W2028436610 @default.
• W2003243790 cites W2045197688 @default.
• W2003243790 cites W2069012355 @default.
• W2003243790 cites W2080256638 @default.
• W2003243790 cites W2082960646 @default.
• W2003243790 cites W2096470311 @default.
• W2003243790 cites W2102617527 @default.
• W2003243790 cites W2105401464 @default.
• W2003243790 cites W2109272991 @default.
• W2003243790 cites W2117314013 @default.
• W2003243790 cites W2124479423 @default.
• W2003243790 cites W2138384063 @default.
• W2003243790 cites W2138404515 @default.
• W2003243790 cites W2139254411 @default.
• W2003243790 cites W2155640457 @default.
• W2003243790 cites W2164674249 @default.
• W2003243790 cites W2167903456 @default.
• W2003243790 cites W2171590793 @default.
• W2003243790 cites W2327150258 @default.
• W2003243790 cites W3150611138 @default.
• W2003243790 doi "https://doi.org/10.1109/jetcas.2014.2374291" @default.
• W2003243790 hasPublicationYear "2015" @default.
• W2003243790 type Work @default.
• W2003243790 sameAs 2003243790 @default.
• W2003243790 citedByCount "61" @default.
• W2003243790 countsByYear W20032437902015 @default.
• W2003243790 countsByYear W20032437902016 @default.
• W2003243790 countsByYear W20032437902017 @default.
• W2003243790 countsByYear W20032437902018 @default.
• W2003243790 countsByYear W20032437902019 @default.
• W2003243790 countsByYear W20032437902020 @default.
• W2003243790 countsByYear W20032437902021 @default.
• W2003243790 countsByYear W20032437902022 @default.
• W2003243790 crossrefType "journal-article" @default.
• W2003243790 hasAuthorship W2003243790A5018693228 @default.
• W2003243790 hasAuthorship W2003243790A5037048702 @default.
• W2003243790 hasAuthorship W2003243790A5039679140 @default.
• W2003243790 hasAuthorship W2003243790A5043223926 @default.
• W2003243790 hasAuthorship W2003243790A5064212027 @default.
• W2003243790 hasAuthorship W2003243790A5066473925 @default.
• W2003243790 hasAuthorship W2003243790A5076905500 @default.
• W2003243790 hasConcept C111919701 @default.
• W2003243790 hasConcept C120314980 @default.
• W2003243790 hasConcept C121332964 @default.
• W2003243790 hasConcept C127413603 @default.
• W2003243790 hasConcept C142362112 @default.
• W2003243790 hasConcept C149635348 @default.
• W2003243790 hasConcept C152124472 @default.
• W2003243790 hasConcept C153349607 @default.
• W2003243790 hasConcept C163258240 @default.
• W2003243790 hasConcept C200601418 @default.
• W2003243790 hasConcept C24326235 @default.
• W2003243790 hasConcept C2777402240 @default.
• W2003243790 hasConcept C2779960059 @default.
• W2003243790 hasConcept C2780799671 @default.
• W2003243790 hasConcept C2994168587 @default.
• W2003243790 hasConcept C41008148 @default.
• W2003243790 hasConcept C43214815 @default.
• W2003243790 hasConcept C46891859 @default.
• W2003243790 hasConcept C62520636 @default.
• W2003243790 hasConcept C63540848 @default.
• W2003243790 hasConcept C9390403 @default.
• W2003243790 hasConceptScore W2003243790C111919701 @default.
• W2003243790 hasConceptScore W2003243790C120314980 @default.
• W2003243790 hasConceptScore W2003243790C121332964 @default.
• W2003243790 hasConceptScore W2003243790C127413603 @default.
• W2003243790 hasConceptScore W2003243790C142362112 @default.
• W2003243790 hasConceptScore W2003243790C149635348 @default.
• W2003243790 hasConceptScore W2003243790C152124472 @default.
• W2003243790 hasConceptScore W2003243790C153349607 @default.
• W2003243790 hasConceptScore W2003243790C163258240 @default.

• next