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• W2003286402 abstract "We have studied silicon-oxygen alloys by infra-red (IR), X-ray photoelectron (XPS) and Auger electron (AES) spectroscopies. The IR and XPS features scale with the average alloy composition, whilst the AES spectrum gives details of the valence band structure." @default.
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• W2003286402 date "1985-12-01" @default.
• W2003286402 modified "2023-09-27" @default.
• W2003286402 title "A study of electronic states in a-SiOx and a-SiNx thin films by infrared, auger electron and X-ray photoelectron spectroscopies" @default.
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• W2003286402 doi "https://doi.org/10.1016/0022-3093(85)90813-0" @default.
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