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- W2003299559 abstract "Initially polished and rough silicon were irradiated by nanosecond laser beam in distilled water. Analysis of SEM images and reflectivity results show that the structures density and reflectivity of silicon are influenced by laser pulse number and target characteristics." @default.
- W2003299559 created "2016-06-24" @default.
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- W2003299559 date "2012-01-01" @default.
- W2003299559 modified "2023-09-26" @default.
- W2003299559 title "Submicron structures formation at initially polished and roughened silicon surface irradiated by nanosecond laser pulses in distilled water" @default.
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- W2003299559 doi "https://doi.org/10.1364/e2.2012.jm5a.12" @default.
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