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- W2003455949 abstract "We report optimized precise alignment of individual single-walled carbon nanotubes (SWCNTs) by the resist-assisted AC-dielectrophoresis (DEP) method. We can reproducibly control the alignment precision to sub-50 nm by customizing the critical DEP parameters, such as: applied AC signal, trapping time, solution concentration, intrinsic properties of the CNTs and so on. The self-aligned CNT field-effect transistors (FETs) have proven to be electrically robust. Therefore, this method holds promise for bottom-up fabrication of high-quality nanoelectronic devices for digital and analog applications with high yield and uniformity." @default.
- W2003455949 created "2016-06-24" @default.
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- W2003455949 date "2012-08-01" @default.
- W2003455949 modified "2023-10-02" @default.
- W2003455949 title "Precise alignment of individual carbon nanotubes for nanoelectronics" @default.
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- W2003455949 doi "https://doi.org/10.1109/nano.2012.6322187" @default.
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