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• W2003698976 abstract "Molybdenum–silicon multilayers have been synthesized using electron beam evaporation method. The chemical nature of surfaces and interfaces are probed using a depth profile X-ray photoelectron spectroscopy. X-ray photoelectron spectroscopy results indicate the formation of MoSi2 phase on both the interfaces. The experimental results agree well with predicted results based on solid-state amorphizing reaction, as a result of large heat of mixing. The effective heat of formation model reveals the formation of MoSi2 as the first phase." @default.
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• W2003698976 date "2006-07-01" @default.
• W2003698976 modified "2023-10-02" @default.
• W2003698976 title "Interlayer composition in Mo–Si multilayers using X-ray photoelectron spectroscopy" @default.
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• W2003698976 doi "https://doi.org/10.1016/j.elspec.2006.04.005" @default.
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