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• W2003752253 abstract "Abstract Titanium and aluminium nitride thin films, Ti 1 − x Al x N (x = 0, x = 0.5, x = 0.68), deposited by reactive magnetron sputtering on silicon substrates are investigated by combining two different X-ray diffraction experiments carried out using synchrotron radiation. Grazing-incidence X-ray diffraction and Ti K-edge diffraction anomalous near edge structure spectroscopy provide information on the micro- and nano-structure of the films respectively, which play a crucial role in the functionality of coatings. The spectroscopic data of Ti 0.50 Al 0.50 N film show that Ti atoms in crystallized domains and grain boundaries are all in octahedral cubic local order, but their growth mode is quite different. It is found that the crystallized part of the Ti 0.50 Al 0.50 N film has a single-crystalline nature, whereas the TiN one presents a fibrillar microstructure. For Ti 0.32 Al 0.68 N film, grazing-incidence X-ray diffraction provides information on the uniaxial texture along the [001] direction of the hexagonal lattice. A sharp Ti K pre-edge peak is observed in diffraction anomalous near edge spectrum that definitely shows that Ti atoms are incorporated in the hexagonal lattice of those fibrillar domains. Moreover, the difference observed between Ti K-edge diffraction anomalous and X-ray absorption pre-edge regions proves that a significant part of Ti atoms is located in nanocrystallites with cubic symmetry outside of the crystallized domains." @default.
• W2003752253 created "2016-06-24" @default.
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• W2003752253 date "2012-12-01" @default.
• W2003752253 modified "2023-10-18" @default.
• W2003752253 title "Nano-structured titanium and aluminium nitride coatings: Study by grazing incidence X-ray diffraction and X-ray absorption and anomalous diffraction" @default.
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• W2003752253 doi "https://doi.org/10.1016/j.tsf.2012.10.120" @default.
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