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- W2003965206 abstract "Abstract Analytical techniques sensitive to the surface and near-surface are useful in determining the composition of coatings which are thin and which contain elements of low atomic number. The surface-sensitive techniques of Auger electron spectroscopy, X-ray photoelectron spectroscopy, ion scattering spectrometry and secondary ion mass spectrometry and the near-surface-sensitive techniques of Rutherford backscattering, nuclear reaction analysis and ion-induced X-rays are described in this review. The principles of these techniques are discussed and the techniques are compared on the basis of elemental analysis (sensitivity, resolution, ditection limits and quantification), chemical state determination, depth distribution, lateral resolution, sample requirements and sample alterations. Advantages and disadvantages are discussed for each technique as an aid to determining which technique is most suitable for a given problem." @default.
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- W2003965206 title "Chemical characterization of coatings by analytical techniques sensitive to the surface and near-surface" @default.
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- W2003965206 doi "https://doi.org/10.1016/0040-6090(78)90364-4" @default.
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