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- W2004184815 abstract "We present results on the characterization of a highly efficient CZTSSe solar cell fabricated using a solution-based process, aiming to gain a better understanding of its efficiency-limiting causes. Under red light illumination, we observed a red-kink in the current-density versus voltage (J-V) curve, likely due to a persistent photoconductivity in the buffer layer. Temperature-dependent J-V analysis suggests that interface recombination is the dominant loss mechanism. Defect analysis using admittance spectroscopy (AS) shows a single bulk defect level at ∼63 meV and may be attributed to copper vacancy (V <inf xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>Cu</inf> ). The carrier concentration of the device determined using drive-level capacitance profiling (DLCP) is ∼2.5×10 <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>16</sup> cm <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>−3</sup> ." @default.
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- W2004184815 date "2012-06-01" @default.
- W2004184815 modified "2023-10-13" @default.
- W2004184815 title "Characterization and understanding of performance losses in a highly efficient solution-processed CZTSSe thin-film solar cell" @default.
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- W2004184815 doi "https://doi.org/10.1109/pvsc.2012.6317874" @default.
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