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- W2004189076 abstract "By using a simplified time domain modeling approach, the temperature dependent performance characteristics such as multiplication gain and bandwidth are studied for InP/InGaAs separate absorption, grading, charge and multiplication (SAGCM) APDs within the temperature range from -243 to 358 K. The modeling approach is improved to consider the effects of hole diffusion, hole trapping, load circuit RC and gain-bandwidth product limit together with the fast Fourier transformation component of the impulse response from the time domain computation. The modeling results agree with experiments. The effects of changing material parameters on modeling are also discussed. The improved performance characteristics also indicate the potential application prospects of InP/InGaAs SAGCM APDs in low temperature environments." @default.
- W2004189076 created "2016-06-24" @default.
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- W2004189076 date "2001-06-12" @default.
- W2004189076 modified "2023-09-27" @default.
- W2004189076 title "<title>Time-domain modeling of InP/InGaAs avalanche photodiodes</title>" @default.
- W2004189076 doi "https://doi.org/10.1117/12.429427" @default.
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