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• W2004263026 abstract "of these erosion trends has been established since the completion of the two lifetests. A two-dimensional model of the partially ionized gas inside these devices has been developed and applied to the neutralizer hollow cathode. The numerical simulations show that the main mechanism responsible for the channel erosion is sputtering by Xe � . These ions are accelerated by the sheath along the channel and bombard the surface with kinetic energy/charge of about 17 V at the beginning of cathode life. The density of the ions inside the neutralizer orifice is computed to be as high as 2:1 � 10 22 m � 3 . Because of the 3.5-times larger diameter of the discharge cathode orifice, the ion density inside the orifice is more than 40 times lower and the sheath drop 7 V lower compared with the values in the neutralizer. At these conditions, Xe � can cause no significant sputtering of the surface." @default.
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• W2004263026 date "2008-07-01" @default.
• W2004263026 modified "2023-10-02" @default.
• W2004263026 title "Wear Mechanisms in Electron Sources for Ion Propulsion, 1: Neutralizer Hollow Cathode" @default.
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