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• W2004363035 abstract "Abstract Electron-energy-loss spectroscopy (EELS) in a conventional transmission electron microscope has been used to measure inner-shell cross-sections for aluminium, silver, indium, tin, antimony, tellurium and hafnium, using elemental thin films of known mass-thickness as standards. The results are presented in the form of differential and integral (dipole) oscillator strengths, in order to make them more widely useful for elemental microanalysis by EELS or X-ray absorption spectroscopy, and allowing comparison with previous experimental data and with the predictions of atomic theory." @default.
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• W2004363035 date "1992-11-01" @default.
• W2004363035 modified "2023-10-14" @default.
• W2004363035 title "Measurements of oscillator strength for use in elemental analysis" @default.
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• W2004363035 doi "https://doi.org/10.1080/13642819208207668" @default.
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