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- W2004526677 abstract "Desorption induced by low energy electron beams incident on thin LiF films has been investigated by means of a quadrupole mass spectrometer operating in a pulse-counting mode. The relative yields at near threshold energy were found to be sensitive to the sample temperature and pre-irradiation dose. The low energy electron stimulated desorption thresholds for Li, F and H were measured relative to the target current onset." @default.
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- W2004526677 date "2001-07-01" @default.
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- W2004526677 title "Thresholds of ESD for LiF thin layers" @default.
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- W2004526677 doi "https://doi.org/10.1016/s0042-207x(01)00163-4" @default.
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