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• W2004661619 startingPage "1052" @default.
• W2004661619 abstract "Improving the throughput of atomic force microscope (AFM) lithography is an important success factor for employing it in nanolithography applications. The conventional motion of the AFM tube scanner is usually driven by triangular-shaped signals, but it is limited in speed due to mechanical instability of the scanner at the turning points. Here, we show that high-speed lithography is achievable using not only a piezo tube driven by a sinusoidal waveform signal but also highly sensitive noble organic resists including a photo acid generator. Cross-linked polymer nanostructures applying sinusoidal waveform driving have also shown improvements in the linearity and uniformity of line patterns." @default.
• W2004661619 created "2016-06-24" @default.
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• W2004661619 date "2009-07-01" @default.
• W2004661619 modified "2023-10-14" @default.
• W2004661619 title "High-speed atomic force microscope lithography using a piezo tube scanner driven by a sinusoidal waveform" @default.
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• W2004661619 doi "https://doi.org/10.1016/j.ultramic.2009.03.021" @default.
• W2004661619 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/19345504" @default.
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