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• W2004679658 abstract "The surface morphology evolution of three thin polystyrene (PS)/polymethyl methacrylate (PMMA) blend films (<70 nm) on SiOx substrates upon annealing were investigated by atomic force microscopy (AFM) and some interesting phenomena were observed. All the spin-coated PS/PMMA blend films were not in thermodynamic equilibrium. For the 67.1 and the 27.2 nm PS/PMMA blend films, owing to the low mobility of the PMMA-rich phase layer at substrate surfaces and interfacial stabilization caused by long-range van der Waals forces of the substrates, the long-lived metastable surface morphologies (the foam-like and the bicontinuous morphologies) were first observed. For the two-dimensional ultrathin PS/PMMA blend film (16.3 nm), the discrete domains of the PS-rich phases upon the PMMA-rich phase layer formed and the secondary phase separation occurred after a longer annealing time." @default.
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• W2004679658 date "2004-05-01" @default.
• W2004679658 modified "2023-09-23" @default.
• W2004679658 title "Annealing effects on the surface morphologies of thin PS/PMMA blend films with different film thickness" @default.
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• W2004679658 doi "https://doi.org/10.1016/j.apsusc.2004.02.046" @default.
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