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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2004758375> ?p ?o ?g. }

• W2004758375 abstract "The temperature dependence of cathodoluminescence (CL) spectra is measured on n-GaN grown on a Si (111) substrate patterned by deep etching in the temperature range 6–280 K. The temperature dependence of the peak energy of A free exciton (FXA) and its 1LO and 2LO phonon replicas are obtained. The stress distribution from corner to center in the patterned mesa area at low temperature 10 K is estimated roughly by FXA energy using a line scanning measurement of the CL spectra. The maximum tensile stress at a point far from the mesa edge is about 0.6 GPa and relaxed to 0.1 GPa at the corner. The relaxation distance extends to about 40 μm." @default.
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• W2004758375 date "2007-11-15" @default.
• W2004758375 modified "2023-10-17" @default.
• W2004758375 title "Temperature dependence of cathodoluminescence spectra and stress analysis of a GaN layer grown on a mesa structured Si substrate" @default.
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• W2004758375 doi "https://doi.org/10.1063/1.2817614" @default.
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