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- W2004874575 abstract "The transformation reactions of copper centers by annealing in Schottky electrode-formed (EL-formed) silicon crystals diffused with copper were measured by deep-level transient spectroscopy (DLTS) and the results were compared with those measured in samples without electrode (EL-free). The dissociation speeds of the dominant center (denoted as the CuDLB center) to the dissociation product (denoted as the CuDLA center) in the EL-formed samples were more than two orders faster than those in EL-free samples at respective annealing temperatures, although the dissociation energy of the former center was identical in both samples. An extended copper center, which was never observed in EL-free samples, was formed in the EL-formed samples at the cost of the CuDLA center. The origins of these specialties in the EL-formed samples were attributed to the actions of the electric field on the copper species in the space-charge region of the samples. The easy dissociation of the CuDLA center in the EL-formed samples was explained by the change in the charge state of the center in the space-charge region of the samples. From this analysis, the positively charged copper bonded at the bond center (CuBC+) was proposed as the most probable model for the CuDLA center." @default.
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- W2004874575 date "2012-09-15" @default.
- W2004874575 modified "2023-09-26" @default.
- W2004874575 title "Transformation reactions of copper centers in the space-charge region of a copper-diffused silicon crystal measured by deep-level transient spectroscopy" @default.
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- W2004874575 doi "https://doi.org/10.1063/1.4754862" @default.
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