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• W2004991645 endingPage "3158" @default.
• W2004991645 startingPage "3150" @default.
• W2004991645 abstract "A theory of the current-ratio (CR) technique in uniform semiconductors, which is widely used to locate gate oxide breakdown (BD) spots in one dimension (i.e., distance from source or drain), is proposed and verified. The theory shows that the CR method is a special case of generalized van der Pauw technique and, as such, can easily be generalized to locate oxide BD spots in two dimensions. We develop the theoretical framework of this new class of BD-spot characterization techniques and then validate the theory by experiments. We conclude by discussing the implications of locating BD spots in two dimensions for reliability projections of ultrathin gate oxides." @default.
• W2004991645 created "2016-06-24" @default.
• W2004991645 creator A5046217654 @default.
• W2004991645 creator A5058263075 @default.
• W2004991645 creator A5071875860 @default.
• W2004991645 date "2008-11-01" @default.
• W2004991645 modified "2023-09-29" @default.
• W2004991645 title "Theory of Breakdown Position Determination by Voltage- and Current-Ratio Methods" @default.
• W2004991645 cites W1526538097 @default.
• W2004991645 cites W1596610289 @default.
• W2004991645 cites W1988355739 @default.
• W2004991645 cites W1999743588 @default.
• W2004991645 cites W2018432221 @default.
• W2004991645 cites W2018711461 @default.
• W2004991645 cites W2029316851 @default.
• W2004991645 cites W2029437716 @default.
• W2004991645 cites W2035635244 @default.
• W2004991645 cites W2046465070 @default.
• W2004991645 cites W2059074447 @default.
• W2004991645 cites W2077969339 @default.
• W2004991645 cites W2086663653 @default.
• W2004991645 cites W2099889471 @default.
• W2004991645 cites W2102434753 @default.
• W2004991645 cites W2120712411 @default.
• W2004991645 cites W2136122966 @default.
• W2004991645 cites W2139006661 @default.
• W2004991645 cites W2144321909 @default.
• W2004991645 cites W2146982716 @default.
• W2004991645 cites W2147842458 @default.
• W2004991645 cites W2149274890 @default.
• W2004991645 cites W2151467153 @default.
• W2004991645 cites W2156455103 @default.
• W2004991645 cites W2158043128 @default.
• W2004991645 cites W2540587124 @default.
• W2004991645 cites W4236419838 @default.
• W2004991645 cites W4246646883 @default.
• W2004991645 cites W4294576166 @default.
• W2004991645 doi "https://doi.org/10.1109/ted.2008.2004483" @default.
• W2004991645 hasPublicationYear "2008" @default.
• W2004991645 type Work @default.
• W2004991645 sameAs 2004991645 @default.
• W2004991645 citedByCount "31" @default.
• W2004991645 countsByYear W20049916452012 @default.
• W2004991645 countsByYear W20049916452013 @default.
• W2004991645 countsByYear W20049916452014 @default.
• W2004991645 countsByYear W20049916452015 @default.
• W2004991645 countsByYear W20049916452016 @default.
• W2004991645 countsByYear W20049916452017 @default.
• W2004991645 countsByYear W20049916452018 @default.
• W2004991645 countsByYear W20049916452019 @default.
• W2004991645 countsByYear W20049916452023 @default.
• W2004991645 crossrefType "journal-article" @default.
• W2004991645 hasAuthorship W2004991645A5046217654 @default.
• W2004991645 hasAuthorship W2004991645A5058263075 @default.
• W2004991645 hasAuthorship W2004991645A5071875860 @default.
• W2004991645 hasConcept C10138342 @default.
• W2004991645 hasConcept C113196181 @default.
• W2004991645 hasConcept C119599485 @default.
• W2004991645 hasConcept C121332964 @default.
• W2004991645 hasConcept C127413603 @default.
• W2004991645 hasConcept C134112204 @default.
• W2004991645 hasConcept C148043351 @default.
• W2004991645 hasConcept C162324750 @default.
• W2004991645 hasConcept C163258240 @default.
• W2004991645 hasConcept C165801399 @default.
• W2004991645 hasConcept C185592680 @default.
• W2004991645 hasConcept C191897082 @default.
• W2004991645 hasConcept C192562407 @default.
• W2004991645 hasConcept C198082294 @default.
• W2004991645 hasConcept C202444582 @default.
• W2004991645 hasConcept C24326235 @default.
• W2004991645 hasConcept C2779851234 @default.
• W2004991645 hasConcept C30475298 @default.
• W2004991645 hasConcept C33676613 @default.
• W2004991645 hasConcept C33923547 @default.
• W2004991645 hasConcept C43214815 @default.
• W2004991645 hasConcept C43617362 @default.
• W2004991645 hasConcept C49040817 @default.
• W2004991645 hasConcept C62520636 @default.
• W2004991645 hasConcept C69990965 @default.
• W2004991645 hasConcept C82558694 @default.
• W2004991645 hasConcept C85443114 @default.
• W2004991645 hasConceptScore W2004991645C10138342 @default.
• W2004991645 hasConceptScore W2004991645C113196181 @default.
• W2004991645 hasConceptScore W2004991645C119599485 @default.
• W2004991645 hasConceptScore W2004991645C121332964 @default.
• W2004991645 hasConceptScore W2004991645C127413603 @default.
• W2004991645 hasConceptScore W2004991645C134112204 @default.
• W2004991645 hasConceptScore W2004991645C148043351 @default.
• W2004991645 hasConceptScore W2004991645C162324750 @default.
• W2004991645 hasConceptScore W2004991645C163258240 @default.
• W2004991645 hasConceptScore W2004991645C165801399 @default.
• W2004991645 hasConceptScore W2004991645C185592680 @default.
• W2004991645 hasConceptScore W2004991645C191897082 @default.
• W2004991645 hasConceptScore W2004991645C192562407 @default.
• W2004991645 hasConceptScore W2004991645C198082294 @default.
• W2004991645 hasConceptScore W2004991645C202444582 @default.
• W2004991645 hasConceptScore W2004991645C24326235 @default.

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