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• W2005005893 abstract "By applying an analytical model of charged dielectric particle interactions, the physics of attachment and detachment in an applied static field is analyzed. It is shown that differences between electric field detachment and mechanical detachment, as reported from prior experiments, have fundamental theoretical basis. Described physics includes a maximum electrostatic detaching force, the enhancement in adhesion force due to particle polarization, the effective reduction in detachment force in a detaching electrostatic field, and the ineffectiveness of an applied field to detach weakly charged particles. Additionally, closed-form equations are provided for approximate calculations of the physical effects." @default.
• W2005005893 created "2016-06-24" @default.
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• W2005005893 date "2013-04-08" @default.
• W2005005893 modified "2023-10-07" @default.
• W2005005893 title "Nonlinear nature of micro-particle detachment by an applied static field" @default.
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• W2005005893 doi "https://doi.org/10.1063/1.4801935" @default.
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