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- W2005373586 abstract "From a detailed study of two different defects in silicon, excitonic Auger capture is shown to be an important mechanism of the configurational change of metastable defects. A free exciton interacts with the defect and recombines, transferring its energy to an electron, which will be emitted high up into the conduction band. This hot Auger electron will quickly reach the bottom of the conduction band. The liberated energy may excite the defect above the barrier between the two configurations." @default.
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- W2005373586 date "1993-07-19" @default.
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- W2005373586 title "Mechanism of the configurational change of metastable defects in silicon" @default.
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- W2005373586 doi "https://doi.org/10.1103/physrevlett.71.416" @default.
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