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• W2005552023 endingPage "11722" @default.
• W2005552023 startingPage "11716" @default.
• W2005552023 abstract "High-resolution low-energy electron-diffraction measurements of the temperature dependence of the behavior of vicinal surfaces of Si(111) misoriented towards the [2ifmmodebarelsetextasciimacronfi{}11] and [11ifmmodebarelsetextasciimacronfi{}0] directions by 1ifmmode^circelsetextdegreefi{} are presented. Consistent with previous studies on Si surfaces misoriented by more than 4ifmmode^circelsetextdegreefi{} from the (111) plane, both of these types of surfaces are observed to facet, or phase separate, reversibly as the temperature is lowered through the (1ifmmodetimeselsetexttimesfi{}1) to (7ifmmodetimeselsetexttimesfi{}7) transition. A recently proposed model for the observed faceting of Si predicts that the temperature-orientation phase diagram for this faceting is governed by the same critical exponent which governs the way equilibrium crystal shapes curve away from facets at nonzero temperatures. Measurements on the 1ifmmode^circelsetextdegreefi{} misoriented samples allow better comparison with this theory: the measured phase diagram for surfaces misoriented towards the high-symmetry [2ifmmodebarelsetextasciimacronfi{}11] direction is consistent with the exponent prediction. Surfaces with reduced coherence lengths have a quantitatively different phase diagram. Changing the direction of the misorientation towards the low-symmetry [11ifmmodebarelsetextasciimacronfi{}0] direction gives a phase diagram inconsistent with universal behavior." @default.
• W2005552023 created "2016-06-24" @default.
• W2005552023 creator A5042017486 @default.
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• W2005552023 date "1989-12-15" @default.
• W2005552023 modified "2023-09-26" @default.
• W2005552023 title "High-resolution low-energy electron-diffraction study of the phase diagram of vicinal Si(111) surfaces" @default.
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• W2005552023 doi "https://doi.org/10.1103/physrevb.40.11716" @default.
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