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• W2005842705 endingPage "15900" @default.
• W2005842705 startingPage "15896" @default.
• W2005842705 abstract "The scanning tunneling microscopy atom-tracking technique is used to follow the individual diffusive hops of single H and D atoms on the Si(001) surface in ultrahigh vacuum. Attempt frequencies and activation energies for diffusion along the dimer row (intrarow) and between the atoms of a single Si dimer (intradimer) are extracted. For intrarow H diffusion, an activation energy of 1.75ifmmodepmelsetextpmfi{}0.10 eV and an attempt frequency of ${10}^{14.5ifmmodepmelsetextpmfi{}0.8}mathrm{Hz}$ are found. For intradimer H diffusion, an activation energy of 1.01ifmmodepmelsetextpmfi{}0.05 eV and a low attempt frequency of ${10}^{10.3ifmmodepmelsetextpmfi{}0.5}mathrm{Hz}$ are found. The ratios of H to D attempt frequencies for intradimer and intrarow diffusion are also determined." @default.
• W2005842705 created "2016-06-24" @default.
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• W2005842705 date "1999-12-15" @default.
• W2005842705 modified "2023-10-16" @default.
• W2005842705 title "Diffusion of hydrogen on the Si(001) surface investigated by STM atom tracking" @default.
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• W2005842705 doi "https://doi.org/10.1103/physrevb.60.15896" @default.
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