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- W2006108475 endingPage "87" @default.
- W2006108475 startingPage "79" @default.
- W2006108475 abstract "Abstract Masses, yields and emission energies of secondary ions have been systematically measured for solid targets bombarded by Si ions over an energy range between 0.5 and 5 MeV for studying roles of the electronic collision in the formation process of secondary atomic ions. The targets used were insulators (Al 2 O 3 , SiO 2 ), semiconductors (Si, GaP, GaAs, GaSb and InSb) and a metal (Al). The obtained feature of the secondary ion emission depends characteristically on the target species. Singly and multiply charged positive ions are produced for Al, Si and P, respectively, from the Al, Al 2 O 3 , Si, SiO 2 and GaP targets. In the cases of GaAs, GaSb and InSb, however, the production rates of positive As and Sb ions are strongly depressed. The obtained emission energy distributions of atomic ions from the conductor and the semiconductors are very broad and have gradually decaying tails at the high-energy side in contradiction to those of singly charged atomic and cluster ions from the insulators. The most probable and mean energies of atomic ions are proportional to their electric charge irrespective of the target conductivity. Large cluster ions are produced from the SiO 2 , Al 2 O 3 , GaSb and InSb targets. The yields of clusters from SiO 2 , GaSb and InSb show power-law dependences on their sizes and the yield of clusters from Al 2 O 3 decreases exponentially with increasing size. These results show that the clusters from SiO 2 , GaSb and InSb are emitted directly from the surface. The clusters from Al 2 O 3 may be indirectly produced by coagulation of molecules in a selvage region near the surface." @default.
- W2006108475 created "2016-06-24" @default.
- W2006108475 creator A5016854005 @default.
- W2006108475 creator A5078321286 @default.
- W2006108475 date "2004-03-01" @default.
- W2006108475 modified "2023-09-27" @default.
- W2006108475 title "Material dependence of electronic sputtering induced by MeV-energy heavy ions" @default.
- W2006108475 cites W1535313585 @default.
- W2006108475 cites W1972555204 @default.
- W2006108475 cites W1973740436 @default.
- W2006108475 cites W1983573213 @default.
- W2006108475 cites W1987258759 @default.
- W2006108475 cites W1987671991 @default.
- W2006108475 cites W1995980075 @default.
- W2006108475 cites W1999736713 @default.
- W2006108475 cites W2000273967 @default.
- W2006108475 cites W2004262397 @default.
- W2006108475 cites W2007053141 @default.
- W2006108475 cites W2009289134 @default.
- W2006108475 cites W2011919472 @default.
- W2006108475 cites W2017617485 @default.
- W2006108475 cites W2017995901 @default.
- W2006108475 cites W2022223782 @default.
- W2006108475 cites W2022921336 @default.
- W2006108475 cites W2025159888 @default.
- W2006108475 cites W2036681086 @default.
- W2006108475 cites W2038531537 @default.
- W2006108475 cites W2043674648 @default.
- W2006108475 cites W2044865468 @default.
- W2006108475 cites W2047760402 @default.
- W2006108475 cites W2064134641 @default.
- W2006108475 cites W2064254406 @default.
- W2006108475 cites W2075320849 @default.
- W2006108475 cites W2076028080 @default.
- W2006108475 cites W2078617817 @default.
- W2006108475 cites W2085726142 @default.
- W2006108475 cites W2094464646 @default.
- W2006108475 cites W2118888132 @default.
- W2006108475 cites W2132905138 @default.
- W2006108475 cites W2135873985 @default.
- W2006108475 doi "https://doi.org/10.1016/j.vacuum.2003.12.026" @default.
- W2006108475 hasPublicationYear "2004" @default.
- W2006108475 type Work @default.
- W2006108475 sameAs 2006108475 @default.
- W2006108475 citedByCount "5" @default.
- W2006108475 crossrefType "journal-article" @default.
- W2006108475 hasAuthorship W2006108475A5016854005 @default.
- W2006108475 hasAuthorship W2006108475A5078321286 @default.
- W2006108475 hasConcept C121332964 @default.
- W2006108475 hasConcept C145148216 @default.
- W2006108475 hasConcept C171250308 @default.
- W2006108475 hasConcept C178790620 @default.
- W2006108475 hasConcept C184779094 @default.
- W2006108475 hasConcept C185592680 @default.
- W2006108475 hasConcept C19067145 @default.
- W2006108475 hasConcept C192562407 @default.
- W2006108475 hasConcept C22423302 @default.
- W2006108475 hasConcept C2988362075 @default.
- W2006108475 hasConceptScore W2006108475C121332964 @default.
- W2006108475 hasConceptScore W2006108475C145148216 @default.
- W2006108475 hasConceptScore W2006108475C171250308 @default.
- W2006108475 hasConceptScore W2006108475C178790620 @default.
- W2006108475 hasConceptScore W2006108475C184779094 @default.
- W2006108475 hasConceptScore W2006108475C185592680 @default.
- W2006108475 hasConceptScore W2006108475C19067145 @default.
- W2006108475 hasConceptScore W2006108475C192562407 @default.
- W2006108475 hasConceptScore W2006108475C22423302 @default.
- W2006108475 hasConceptScore W2006108475C2988362075 @default.
- W2006108475 hasIssue "1" @default.
- W2006108475 hasLocation W20061084751 @default.
- W2006108475 hasOpenAccess W2006108475 @default.
- W2006108475 hasPrimaryLocation W20061084751 @default.
- W2006108475 hasRelatedWork W1653219748 @default.
- W2006108475 hasRelatedWork W1850448871 @default.
- W2006108475 hasRelatedWork W1968600571 @default.
- W2006108475 hasRelatedWork W2037765275 @default.
- W2006108475 hasRelatedWork W2063641716 @default.
- W2006108475 hasRelatedWork W2066325085 @default.
- W2006108475 hasRelatedWork W2073706187 @default.
- W2006108475 hasRelatedWork W3022687757 @default.
- W2006108475 hasRelatedWork W3030603465 @default.
- W2006108475 hasRelatedWork W3216533149 @default.
- W2006108475 hasVolume "73" @default.
- W2006108475 isParatext "false" @default.
- W2006108475 isRetracted "false" @default.
- W2006108475 magId "2006108475" @default.
- W2006108475 workType "article" @default.