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• W2006509134 abstract "The reverse recovery failure limit was measured with an optical technique for power diodes which sustain high levels of dynamic avalanche. Measurements and simulations indicate that these diodes wi ..." @default.
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• W2006509134 date "2000-03-01" @default.
• W2006509134 modified "2023-10-02" @default.
• W2006509134 title "Dynamic avalanche in Si power diodes and impact ionization at the nn+ junction" @default.
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• W2006509134 doi "https://doi.org/10.1016/s0038-1101(99)00261-0" @default.
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